Name: High-Resolution Transmission Electron Microscope
Model: JEM-2100F
Origin: Japan
Manufacturer: JEOL Ltd. (Japan Electronics Corporation)
Technical Parameters:
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Electron Gun Type: Schottky Field Emission Gun
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Acceleration Voltage: 200 kV, 120 kV
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Resolution: Point resolution 0.19 nm, Line resolution 0.1 nm
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Tilt Stage: α/β tilt ±25 degrees
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STEM: Resolution 0.2 nm
Main Functions:
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Observation of morphology of solid samples, electron diffraction, and diffraction contrast analysis.
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High-resolution electron microscopy imaging.
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With the scanning attachment, STEM bright-field/dark-field images and atomic number contrast HAADF (High-Angle Annular Dark Field) analysis can be obtained.
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In combination with an X-ray energy-dispersive spectrometer (EDS), it can perform point/line/area distribution analysis of elemental composition.
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It is an effective tool for understanding the microstructure of materials at the nanoscale.
