Model: JEOL JEM-2100F
Place of Production: Japan
Producer: JEOL Ltd.
Technology Parameter:
1.Electron Gun:
Type: Schottky field emission gun
Emission current: 0.5 to 10 µA
Energy spread: 0.7 eV (at 200 kV)
2.Accelerating Voltage:
80 kV, 120 kV, and 200 kV
3.Resolution:
Point Resolution: 0.19 nm
Lattice Resolution: 0.1 nm
Instrument Introduction:
The JEOL JEM-2100F transmission electron microscope (TEM) can be used for analyzing the microscopic morphology, crystal structure, and composition of solid samples, serving as an effective tool for understanding the microstructure of materials at the nanoscale.
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